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Optical absorption spectroscopy by scanning force microscopyNONNENMACHER, M; WICKRAMASINGHE, H. K.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 351-354, issn 0304-3991Conference Paper

Surface investigations with a Kelvin probe force microscopeNONNENMACHER, M; O'BOYLE, M; WICKRAMASINGHE, H. K et al.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 268-273, issn 0304-3991Conference Paper

Force measurement with a piezoelectric cantilever in a scanning force microscopeTANSOCK, J; WILLIAMS, C. C.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1464-1469, issn 0304-3991Conference Paper

Intermolecular and surface forces in noncontact scanning force microscopyHARTMANN, U.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 59-65, issn 0304-3991Conference Paper

Mechanical and thermal effects of laser irradiation on force microscope cantileversMARTI, O; RUF, A; HIPP, M et al.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 345-350, issn 0304-3991Conference Paper

Scanning force microscopy : Close to absolute zeroHUG, Hans Josef.GIT laboratory journal Europe. 2006, Vol 10, Num 2, pp 49-49, issn 1611-6038, 1 p.Article

Sharp, vertical-walled tips for SFM imaging of steep or soft samplesKELLER, D; DEPUTY, D; ALDUINO, A et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1481-1489, issn 0304-3991Conference Paper

Heterodyne force-detection for high frequency local dielectric spectroscopy by scanning Maxwell stress microscopyYOKOYAMA, H; JEFFERY, M. J; INOUE, T et al.Japanese journal of applied physics. 1993, Vol 32, Num 12B, pp L1845-L1848, issn 0021-4922, 2Article

Microlever with combined integrated sensor/actuator functions for scanning force microscopyBRUGGER, J; BLANC, N; RENAUD, P et al.Sensors and actuators. A, Physical. 1994, Vol 43, Num 1-3, pp 339-345, issn 0924-4247Conference Paper

In situ testing and calibration of tube piezoelectric scannersJULIAN CHEN, C.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1653-1658, issn 0304-3991Conference Paper

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Label-Free Biosensing over a Wide Concentration Range with Photonic Force MicroscopySEUNGJIN HEO; KIPOM KIM; CHO, Yong-Hoon et al.ChemPhysChem (Print). 2014, Vol 15, Num 8, pp 1573-1576, issn 1439-4235, 4 p.Article

Blowing DNA bubblesSEVERIN, N; ZHUANG, W; ECKER, C et al.Nano letters (Print). 2006, Vol 6, Num 11, pp 2561-2566, issn 1530-6984, 6 p.Article

Novel design for a compact fiber-optic scanning force microscopeBINGGELI, M; KOTROTSIOS, G; CHRISTOPH, R et al.Review of scientific instruments. 1993, Vol 64, Num 10, pp 2888-2891, issn 0034-6748Article

Interaction force detection in scanning probe microscopy : methods and applicationsDÜRIG, U; ZÜGER, O; STALDER, A et al.Journal of applied physics. 1992, Vol 72, Num 5, pp 1778-1798, issn 0021-8979Article

Domain and surface structuring of LiNbO3 single crystal by scanning force microscopyTERABE, K; LIU, X. Y; LI, X. J et al.Ferroelectrics (Print). 2006, Vol 340, pp 121-128, issn 0015-0193, 8 p.Conference Paper

Nanoscale materials patterning and engineering by atomic force microscopy nanolithographyXIE, X. N; CHUNG, H. J; SOW, C. H et al.Materials science & engineering. R, Reports. 2006, Vol 54, Num 1-2, pp 1-48, issn 0927-796X, 48 p.Article

Contrast mechanism for visualization of ferroelectric domains with scanning force microscopyJUNGK, T; SOERGEL, E.Ferroelectrics (Print). 2006, Vol 334, pp 29-34, issn 0015-0193, 6 p.Conference Paper

Initial bioadhesion on surfaces in the oral cavity investigated by scanning force microscopySCHWENDER, N; HUBER, K; AL MARRAWI, F et al.Applied surface science. 2005, Vol 252, Num 1, pp 117-122, issn 0169-4332, 6 p.Conference Paper

The role of shear forces in scanning force microscopy : a comparison between the jumping mode and tapping modeMORENO-HERRERO, F; DE PABLO, P. J; COLCHERO, J et al.Surface science. 2000, Vol 453, Num 1-3, pp 152-158, issn 0039-6028Article

Using scanning force microscopy (SFM) to investigate various cleaning procedures of different transparent conducting oxide substratesNEL, J. M; DEMANET, C. M; HILLIE, K. T et al.Applied surface science. 1998, Vol 134, Num 1-4, pp 22-30, issn 0169-4332Article

Nanoscale modification of conducting lines with a scanning force microscopeRANK, R; BRÜCKL, H; KRETZ, J et al.Vacuum. 1997, Vol 48, Num 5, pp 467-472, issn 0042-207XArticle

An update on scanning force microscopiesLOUDER, D. R; PARKINSON, B. A.Analytical chemistry (Washington, DC). 1995, Vol 67, Num 9, pp 297A-303A, issn 0003-2700Article

A novel combined scanning tunnelling/scanning force microscopeHAMMICHE, A; WEBB, R. P; WILSON, I. H et al.Vacuum. 1994, Vol 45, Num 5, pp 575-577, issn 0042-207XConference Paper